Scanwel has expanded our range of HOPG considerably and now offers four HOPG types (ZYA, ZYB, ZYD, ZYH). These different grades differ in terms of their mosaic spread and are available in a variety of sizes up to 50x50mm. Both double-sided (DS) and single-sided (SS) HOPG pieces can be ordered.
Anasys Instruments is pleased to announce the introduction of a revolutionary new nanoIR mode that provides unparalleled spatial resolution for chemical imaging down to 10nm, and addresses a wider range of material science research, including polymers, failure analysis, pharmaceuticals, inorganic materials and beyond.
The new patented Tapping AFM-IR mode combines Anasys’ AFM-IR resonance enhanced technique with tapping mode operation. Tapping AFM-IR is available on both the new nanoIR2-FS with FASTspectra, as well as on the multi-purpose nanoIR2-S that combines IR scattering SNOM and our award winning AFM-IR on a single platform.
Tapping AFM-IR demonstrates sub 10 nm imaging resolution on block co-polymer substrate of PS/PMMA, as shown in cross-section.
Learn more about Tapping AFM-IR here.
Santa Barbara, CA. – September 19th, 2016 – Anasys Instruments, the world leader in nanoscale IR spectroscopy, announces its next generation nanoscale IR spectroscopy and chemical imaging system, the nanoIR2-FS™. The nanoIR2-FS™, with new FASTspectra™ technology, sets new standards in measurement speed, resolution, sensitivity, and multi-modal characterization capabilities, while extending its Resonance Enhanced AFM-IR technology to a broader spectroscopic range to provide unrivalled correlation to FTIR at the nanoscale across a wider range of samples.
The nanoIR2-FS incorporates new FASTspectra, a proprietary technology providing an order of magnitude increase in measurement speed, resulting in IR spectra in seconds. The system sets new standards in resolution and sensitivity by utilizing the Resonance Enhanced AFM-IR technique, achieving 25nm spatial resolution, while maintaining monolayer sensitivity.
Additionally, new exclusive FASTspectra laser technology extends the range wavelength range of Resonance Enhanced AFM-IR to cover the 2700 to 3600 cm-1 wavenumber range, setting new standards of resolution and sensitivity for nanoscale IR spectroscopy for an even wider range of applications, while still providing unrivalled correlation to FTIR at the nanoscale.
The nanoIR2-FS also provides unique Point-Spectroscopy capability, enabling both nanoscale IR spectroscopy & chemical imaging from a single laser source, improving user flexibility for advanced experimentation of nanoscale features, and removing the need for multiple laser sources for spectroscopy and imaging.
Multi-modal capabilities are enhanced with new updates for the integrated atomic force microscopy technology, afm+, including new electrical modes, high resolution Kelvin Probe force microscopy, and conductive AFM while adding enhanced fluid imaging capabilities with a new fluid cell.
The nanoIR2-FS provides significant improvements for productivity and ease of use, which will greatly benefit academic users, focused on fast turnaround for publications, as well as industrial users, where time to data and solving problems is a high priority.
“We are pleased to announce our exclusive FASTspectra laser technology for the nanoIR platform,” stated Dean Dawson, Vice President of Marketing & Business Development. “The nanoIR2-FS addresses the requirements for high speed nanoscale IR spectroscopy, and expands its unique multi-modal
capabilities for the most advanced research and industrial applications while improving user productivity.”
This combination of AFM and nanoscale IR spectroscopy & imaging provides the broadest range of nanoscale FTIR characterization techniques available on a single platform, enabling new directions in research for advanced chemical characterization.
To learn more about the nanoIR2-FS, visit http://www.anasysinstruments.com/products/nanoIR2-FS/.
Magnetic measurements in high external magnetic fields demand corresponding coercivity value of MFM tip and stability of its magnetization distribution during imaging. Obviously, applying magnetic field higher than coercivity leads to unavoidable magnetization reversal of magnetic tip and corresponding distortion of magnetic image.
Typical magnetic tips with CoCr coating usually demonstrate coercivity about 200Oe in vertical (Z) direction and 800Oe in horizontal (X or Y) direction perpendicular to the tip axis.
Novel magnetic tips based on Co high coercivity alloy (MFM_HC) posses essentially higher values – 500-800Oe in vertical direction and more than 2kOe in horizontal direction. Therefore new MFM_HC tips open new possibilities in magnetic measurements in high external magnetic fields.
You can find the specification and price information using by clicking HERE
ETALON is a new series of excellent composite AFM probes. In terms of quality-to-price ratio, it has no analogues in the world market.
New NT-MDT technology of combines all critical advantages in one chip:
• Sharp tip (curvature radius about 10 nm)
• Resonance frequency, specified with high accuracy (±4%)
• Special chip geometry for convenient operating
• High aspect ratio tip
• Enhanced back-side reflection of the cantilever
Highly Specified Resonance Frequency
The ETALON Series probes consist of a polysilicon lever with a pedestal and monocrystal silicon tip. Precision technology for polysilicon deposition guarantees the lever thickness control. A special frequency stabilizer is designed to make the dispersion of the resonant frequency and force constant smaller (due to the lever length control). Thanks to the above mentioned facts, the ETALON probes are characterized by highly reproducible parameters:
• Typical dispersion of the lever thickness: ±0.07 µm
• Typical dispersion of the lever length: ±2 µm
• Typical dispersion of the probe resonant frequency: ±4%
• Typical dispersion of the force constant: ±20%.
Example images from Etalon Probes
Many of the images in NT-MDT’s annual ProImage contest and company calendar were taken with ETALON series probes
Due to a thinner magnetic coating layer, Low Moment Magnetic tips MFM_LM enable imaging of low coercitivity magnetic samples, such as iron garnet films with coercitivity of about 20 Oe. Using standard MFM tips leads to perturbation of the magnetic domain pattern and the tip induced local magnetisation reversal of the sample. Low moment MFM tips with reduced magnetic stray fields significantly reduce magnetisation reversal during imaging and improve quality of the MFM results. Special protective layers help to avoid oxidation and increase the cantilever lifetime substantially. The sharp silicon tip facilitates magnetic resolution in the range 20–30 nm.